Research Equipment
Below you will find a research equipment curated list by Research Enhancement. The list is updated upon UTRGV faculty request. UTRGV is always expanding and upgrading the suite of equipment to meet the needs of researchers. Our equipment list is not exhaustive, if you would like to feature your equipment on our Research Enhancement website, please contact research@utrgv.edu.
Ever-Cool-II
Ever-Cool-II is a cryogen-free industry-leading Physical Property Measurement System (PPMS) for accurate measurement of physical properties of different materials, such as AC susceptibility, heat capacity, electrical transport, thermal transport within a wide range of temperatures (1.9-400 K) and under a wide range of magnetic fields (9T). This instrument is capable of reaching sub-Kelvin temperatures.
Bruker ELEXSYS (EPR spectrometer)
The Electron Paramagnetic Resonance spectrometer capable of measurements in a wide range of temperatures (5 K to 500 K) and detection of low spin triplet states. The ELEXSYS platform has high sensitivity (about 109 uncoupled electronic spins per gauss and a signal to noise ratio better than 3000:1 for the weak pitch), high resolution (up to 10-8 T), and wide flexibility. The system has a maximum magnetic field of ~1.5 T without a superconducting magnet. The high resonance field has a special advantage to study materials which the magnetic saturation reaches large magnetic fields. The accessories mainly include: Goniometer for the study of the angular dependence of EPR spectra (necessary to assess the orientation of carbon nanotubes and graphene within polymeric matrices, to quantify the magnetic anisotropy in magnetically ordered samples, and to determine the g tensor principal axis in single crystals). The UV irradiation system provides the possibility for in-situ irradiation of samples of interest in the microwave cavity, especially paramagnetic compounds/species/defects or phase transitions via light irradiation. The instrument will be used in training students to conduct measurements of quantum states of matter (spin density distribution, hyperfine interaction between electron and nuclear spins, nuclear spin relaxation, electron-electron spin dipolar coupling).
JSM-7100F (JEOL): JSM-7100F
SM-7100F (JEOL): JSM-7100F is a Thermal Field Emission Scanning Electron Microscope (SEM) and Transmission Electron Microscope (TEM) with the stunning resolution of 1.2 nm. This instrument has a wide range of applications and is essential for industrial and academic labs: imaging of samples, studies of surface topography of materials, analysis of extremely small structures from different angles. It will be used to support training of students in SEM techniques with direct hands-on experience as well as conducting interdisciplinary research in areas of overlap of physics, chemistry, material science, and engineering.
PIONEER-2 (RAITH)
This instrument combines an Electron Beam Lithography (EBL) system and an analytical Scanning Electron Microscope (SEM). The EBL is indispensable in modern device fabrication at the micro- and nano-meter scale. The SEM is a high-resolution imaging process that is crucial for characterization of micro and nano devices after their fabrication.
X-ray Powder Diffraction: Bruker D2 PHASER 2nd Gen
D2 PHASER is the desktop diffractometer for all X-ray powder diffraction applications in Bragg-Brentano geometry. It is equipped with an integrated flat screen monitor, an integrated PC and an ultra-fast SSD drive. The D2 PHASER is ideal for laboratory or on-location operation with Plugin Analyze system.
Atomic Force Microscope SOLVER (NanoScope, Veeco)
Nano NT-MDT and a high resolution Atomic Force Microscope system (AFM)/Multimode is allows imaging in Contact AFM mode, Constant Height mode, Constant Force mode, Contact Error mode, Lateral Force Imaging, Spreading Resistance Imaging, Force Modulation microscopy, Piezoresponse Force, Intermittent contact mode, Phase Imaging mode, Semicontact Error mode, Non-Contact mode, Electrostatic Force Modes. Contact EFM: Scanning Capacitance Microscopy, Kelvin Probe Force Microscopy. Scanner 100x100x12um closed loop scanner, 3x3x3um open loop scanner. AFM resolution: 0.01 nm. Environments: Air and liquid measurements. Combined video optical microscopes, Build in 100x optical USB microscope. External: 500x optical microscope.
UV-Visible Spectroscope, UV-5500 (PC) UV/VIS Spectrophotometer
UV-VIS spectrophotometer is a Software equipped spectrophotometer with the scanning range 190-1100 nm.
SDT Q600 Simultaneous TGA/DSC
The Q600 provides simultaneous measurement of weight change (TGA) and true differential heat flow (DSC) on the same sample from ambient to 1500 °C. It features a field-proven horizontal dual beam design with automatic beam growth compensation, and the ability to analyze two TGA samples simultaneously. DSC heat flow data is dynamically normalized using the instantaneous sample weight at any given temperature.
Thermo Scientific Nicolet iS5 FTIR Spectrometer
The Thermo Scientific Nicolet iS5 FT-IR spectrometer provides superior FT-IR performance in a compact size. Combining flexible sample handling and leading Thermo Scientific OMNIC software, the Nicolet iS5 spectrometer is the ideal FTIR solution for advanced labs around the world.
Eight Channels Li-ion Battery Analyzer
(6-3000 mA, up to 5V) with Laptop and Software for R&D all Rechargeable Cells -BST8-3: This system provides most applications in battery testing fields such as electrode materials research, battery performance test, small-scale battery formation, capability grading, battery pack testing and etc.
DCS-10, Spark Plasma Sintering System, Thermal Technology LLC
10-Ton, 5000 A power supply, Ram alignment, die-set 10-50 mm (ID).
